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Neutron diffraction study of NiTi during compressive deformation and after shape-memory recovery

作者:科技文献资料网 时间:2017-07-26 12:39:20  浏览:8787   来源:科技文献资料网
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[唯一标识符]:CDSTIC.DOE.100006
[文献来源]:美国能源部报告数据库
[文献类型]:科技报告
[资源原始索取号]:OSTI ID: 100006; Legacy ID: DE95016835
[标题]:Neutron diffraction study of NiTi during compressive deformation and after shape-memory recovery
[作者]:Dunand, D.C.; Mari, D.[Massachusett Inst. of Technology, Cambridge, MA (United States). Dept. of Materials Science and Engineering] ; Bourke, M.A.M.; Goldstone, J.A.[Los Alamos National Lab., NM (United States)]
[关键词]:66 PHYSICS ;36 MATERIALS SCIENCE; NICKEL ALLOYS; NEUTRON DIFFRACTION; COMPRESSION; SHAPE MEMORY EFFECT; TWINNING; STRAINS; TEXTURE; TITANIUM ALLOYS; EXPERIMENTAL DATA
[出版时间]:1995 Sep 01
[出版年份]:1995
[报告号]:LA-UR--95-2345; CONF-9508145--2
[来源关系]:Conference: 8. international conference on martensitic transformations (ICOMAT-8), Lausanne (Switzerland), 20-25 Aug 1995; Other Information: PBD: [1995]
[其他获取途径]:OSTI as DE95016835
[总页数]:10


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[唯一标识符]:CDSTIC.AIAA 2008-0591
[文献来源]:美国航空航天学会会议(AIAA)
[文献类型]:科技会议
[标题]:Investigation of Asymmetric Subharmonic Resonance in a Supersonic Boundary Layer at Mach 2 Using DNS
[作者]:C. Mayer and H. Fasel, The University of Arizona, Tucson, AZ
[出版单位]:美国航空航天局
[文摘]:InvestigationofAsymmetricSubharmonicResonanceinaSupersonicBoundaryLayeratMach2UsingDNSChristianS.J.Mayer,andHermannF.FaselyDepartmentofAerospace&MechanicalEngineering,TheUniversityofArizona,Tucson,AZ85721Thetransitionprocessinasupersonicat-plate
[出版时间]:2008
[出版年份]:2008
[会议名称]:46th AIAA Aerospace Sciences Meeting and Exhibit
[馆藏索取号]:AIAA2008-0591
[总页数]:25


[唯一标识符]:CDSITC.AEROSPACE.N97-29791
[文献来源]:美国航空航天数据库(aerospace)
[资源原始索取号]:N1997-29791; Reference AN: N97-29791
[标题]:STM and X-ray diffraction temperature-dependent growth study of SrRuO3 PLD thin films
[作者]:HAWLEY M E; JIA Q X; BROWN G W
[文摘]:SrRuO3 (SRO) has recently found a number of applications in different fields, e.g. as a buffer layer for the growth of high temperature superconductor (HTS) YBa2Cu3O(7-x) films and as a bottom electrode for ferroelectric or high dielectric constant thin film capacitors and nonvolatile data storage. The growth of high crystallinity SRO films with good structural and electrical properties is the prerequisite for each of these applications. In this paper we describe the affect of one growth parameters temperature (T), on the crystalline quality, epitaxial substrate relationship and resulting electrical properties. SRO films were deposited on LaAlO3 single crystal substrates by pulsed laser deposition at substrate temperatures (T(s)) ranging from room temperature (RT) up to 800 C with a nominal film thickness of 150 nm range. The resulting films were characterized by x-ray diffraction, 4-point transport, and STM. The films' microstructures, as revealed by STM, evolved from polygranular at RT to a layered plate-like structure at higher deposition temperatures, T(s), Increasing T(s) was marked first by increasing grain size, then a stronger orientational relationship between film and substrate, finally followed by the development of increased connectivity between grains to an extended island or condensed layered state. The transition from polygranular to layered structure occurred at T(s) greater than 650 C. Increased conductivity paralleled the changes in microstructure. The surfaces of all of the films were relatively smooth; the oriented films are suitable for use as conductive templates in multilayer structures. (DOE)
[关键词]:CRYSTAL GROWTH; MICROSTRUCTURE ; PULSED LASER DEPOSITION; RUTHENIUM COMPOUNDS; SINGLE CRYSTALS; STRONTIUM OXIDES; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; YBCO SUPERCONDUCTORS; CRYSTALLINITY ; ELECTRICAL RES
[出版年份]:1996
[专业领域]:Solid State Physics

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