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The crack severity index of monitored load spectra

作者:科技文献资料网 时间:2017-06-27 13:24:27  浏览:8176   来源:科技文献资料网
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[唯一标识符]:CDSITC.AEROSPACE.N94-34585
[文献来源]:美国航空航天数据库(aerospace)
[资源原始索取号]:N1994-34585; Reference AN: N94-34585
[标题]:The crack severity index of monitored load spectra
[作者]:DEJONGE J B
[书名]:IN: AGARD, An Assessment of Fatigue Damage and Crack Growth Prediction Techniques 5 p (SEE N1994-34581 10-39)
[来源]:In-AGARD-An-Assessment-of-Fatigue-Damage-and-Crack-Growth-Prediction-Techniques-5-p-(SEE-N1994-34581-10-39)
[文摘]:To assess the consequences with regard to fatigue and damage tolerance of changes in operational usage, a simple means to quantify the relative severity of recorded load spectra is required. This paper describes the development and validation of the 'Crack Severity Index' CSI as a means to express the relative damage in terms of a 'crack growth potential' of stress spectra. The CSI is based on a crack-closure crack growth model and takes account of interaction effects by considering the shape of the spectrum. It is shown that the CSI-concept is a reasonably accurate method to compare the relative severity of maneuver dominated spectra in aluminum alloy structure. (Author (revised))
[关键词]:ALUMINUM ALLOYS; CRACK CLOSURE; CRACK PROPAGATION; FRACTURE MECHANICS; LOADS FORCES; SPECTRA ; SPECTRUM ANALYSIS; STRESS ANALYSIS; TOLERANCES MECHANICS; CRACKS ; DAMAGE ; MATHEMATICAL MODELS
[出版年份]:1994
[专业领域]:STRUCTURAL MECHANICS
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[文献类型]:科技报告
[标题]:Performance of the Barrel CRID at the SLD: Long-term operational experience.
[作者]:K. Abe; V. Ashford; D. Aston;
[机构]:USDOE Office of Energy Research, Washington, DC (United States).
[关键词]:cherenkov counters,stanford linear collider detector, operation, performance, electron detection, meetings,edb/440104, edb/430303
[出版年份]:1999
[报告号]:SLAC-PUB-7705
[报告时间]:30 Nov 97,
[页码]:10p
[馆藏索取号]:DE98059167
[总页数]:0


[文献类型]:科技报告
[标题]:Surface Characterization by Medium Energy Particle Scattering.
[作者]:arps, j. h. weller, r. a.
[机构]:Vanderbilt Univ.,Nashville,TN.
[关键词]:ion beams,forward scattering,reprints,measurement,thickness,detection,detectors,polymers,mass,energy,resolution,thin films,films,optical materials,substrates,semiconductors,electrical properties,depth,hydrogen,surfaces,oxygen,inorganic materials,nuclear scattering,
[出版年份]:1995
[报告时间]:1994,
[页码]:10p
[馆藏索取号]:AD-A291811
[总页数]:0



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